A new quality procedure and metrics has been developed to facilitate the detection of quality problems in various applications including medical device coating, spray drying, mass spectrometry, inhalation (drug delivery), heat transfer, and combustion.

Spray Error Patternation overview

The novel “Spray Error Patternation” method provides quantitative data on the spatially resolved deviations from a reference pattern , referred to as “Spray Patternation (SEP)”. The patented spray characterization method facilitates the evaluation of data relating, among others, to spray surface area, spray density distribution, and/or mass distribution by visualizing deviations or spray errors with respect to an ideal distribution in a two-dimensional plane.

	Information on surface area, position, and size of all detected spray errors within the spray to be analyzed is provided and can be quantified and classified as follows: Spray Error total SEt expresses errors caused by spray under-representation and over-representation.
	Spray Error under-representation SEu is a measure for spray under-representations (e.g., voids) within a spray density distribution. These errors are calculated and visualized in a 2D-intensity plot.
	Spray Error over-representation SEo is a measure for a spray over-representation (excessive spray surface area) within a spray density distribution. These errors are calculated and visualized in a 2D- intensity plot.
	Spray Error frequency expresses the number of spray errors within the spray pattern. The error frequency is calculated for SEo, SEu, and SEt and displayed in a histogram. Spray Error eomax and eumax express the maximum error value for SEo, SEu, and SEt , respectively. Error Index E.I. facilitates the assessment of spray errors caused by spray under- and over-representations.

• The Spray Error Patternation advantage

  New metrics provide relevant spray quality information for improved objectivity and facilitated quality control

  + Enhanced expressiveness and comparability of measurement data
  + Information on spray size and on accurate location, type, and size of spray density distribution deviations within core and periphery of spray.
  + Improved analysis of asymmetric spray distributions and determined areas within a spray distribution.
  

  + 2D visualization of size and position of spray errors
  

  + Quality-by-design measurement rig for improved measurement data reproducibility and enhanced spray pattern and plume scanning.
  + Counterpropagating laser option for improved quality of data acquisition
  + Custom nozzle or spray pump holder for reproducible system setup.

  Publications

  2011
  A new quality methodology for spray pattern analysis, Atomization and Sprays (download here).
  Pending Patent Publications
  2010
  Spray pattern characterization and monitoring method and system, U.S. Patent 7792611.
  2009
  New method for spray pattern characterization of atomizers and inhalation devices, AAPS American Association of Pharmaceutical Scientists Annual Meeting, Los Angeles, USA.
  
• The SEP technology has been successfully used in the development of new atomizers as well as novel medical device coating and material engineering processes as described, for instance, in US Patents 7892593, 7886990, and 7708208.