Spray Error Patternation
Detailed information on spray characteristics is crucial for detecting quality problems in spraying processes and assisting in the design and quality control of atomization devices.
Problem: A limitation of conventional spray diagnostic systems is that only information on specific spray features is provided. The accurate size and location of anomalies within core and periphery of a spray is not assessed. In addition, spray anomalies which may have a major impact on the spray quality in a particular application, may not be detected. Furthermore, there is a need for facilitated spray pattern and plume diagnostics and system calibration.
Solution: ioos' patented Diagnostic Systems (Spray Error Patternators) are based on a novel quality control method that facilitates the automated evaluation of data relating to spray surface area, density distribution, and/or mass distribution by visualizing deviations or "Spray Errors" with respect to a specifically generated reference pattern in a two-dimensional plane. Main features of ioos' Spray Error Patternation (SEP) instrumentation include:
+ Enhanced expressiveness of measurement data and detection of otherwise "invisible" spray features.
+ Spray analysis tailored to specific requirements results in improved spray comparison and on-line process control.
+ Analysis of non-circular and asymmetric patterns and specific areas within a spray distribution.
+ Mathematical description (pattern fitting) of spray allows accurate pattern classification
+ Facilitated pattern and plume analysis and accurate system calibration and validation.
Application example: Spray Error Patternation SEPPAT during coating process
